IEEE Microelectronics Design & Test Symposium

MDTS 2027

Call For Papers

The IEEE Microelectronics Design & Test Symposium (MDTS 2027) provides a forum for researchers, academics, engineers, and industry professionals to discuss recent advances in microelectronics design, testing, semiconductor technologies, and related applications.

MDTS 2027 invites original research papers covering emerging developments in microelectronics design and test, electronic design automation, hardware security, circuits and systems, advanced packaging, artificial intelligence, and emerging semiconductor technologies.

Topics of interest include, but are not limited to:

• Electronic Testing Technologies
• Design for Test
• Electronic Design Automation (EDA)
• Yield Analysis and Optimization
• Hardware and System Security
• Reliability and Resilience
• Analog, Mixed-Signal and RF Circuits and Systems
• Nanoelectronics, Magnetic and Optoelectronic Materials and Devices
• Neuromorphic Engineering
• Quantum Computing
• Power Electronics
• Biomedical, Photonics and Quantum Electronics
• Sensory Circuits and Systems
• Signal Processing
• Artificial Intelligence in Electronics
• Beyond-CMOS Nanoelectronics
• Heterogeneous Integration and Packaging
• Wide Bandgap Technologies
• Semiconductor Digital Twins
• Emerging Technologies and Applications

Paper Submission:

Authors are invited to submit original and unpublished research papers relevant to the symposium. Submission details and deadlines for MDTS 2027 will be announced by the organizers.

Submission Link: https://mdts.ieee.org/

Important Dates:

Publication:

Accepted papers will be considered for publication through the IEEE MDTS publication process.

Contact Us:

Organization: IEEE Microelectronics Design & Test Symposium

Email: N/A

Website: https://mdts.ieee.org/