International Test Conference (ITC 2026)

The International Test Conference (ITC 2026) is the world's premier conference dedicated to the electronic testing of devices, boards and systems. ITC brings together researchers, engineers, practitioners and industry leaders to present innovative research and discuss the latest advances in semiconductor testing, reliability, design verification, manufacturing test and system-level validation.

ITC 2026 invites original, unpublished research papers describing significant contributions in electronic test, design-for-testability, silicon validation, reliability analysis, AI-driven testing, yield improvement and emerging semiconductor technologies.

Topics of interest include but are not limited to, the following

• Design Verification and Validation
• Design-for-Test (DFT)
• Manufacturing Test
• System-Level Test
• Silicon Debug and Failure Analysis
• Diagnosis and Defect Analysis
• Yield Analysis and Optimization
• Reliability and Resilience
• AI and Machine Learning in Test
• Automotive Test
• IoT Test
• Optics and Photonics Test
• Quantum Device Testing
• Protocol-Aware Test
• Emerging Semiconductor Technologies
• Electronic Design Automation
• Embedded System Testing
• Test Standards and Methodologies

Paper Submission

Authors are invited to submit original unpublished papers through the official ITC 2026 paper submission system. Accepted papers will be presented during the conference and included in the conference proceedings.

Submission Link : ITC 2026 Paper Submission System

Important Dates

Publication

Accepted and presented papers will be published in the International Test Conference Proceedings and submitted for inclusion in the IEEE Xplore Digital Library.

Contact Us

For paper submission, registration and conference-related inquiries, please contact the ITC organizing committee.

• International Test Conference Organizing Committee
• Email : itc@computer.org
• Website : https://www.itctestweek.org/